[PDF.15ur] Journey to Data Quality (MIT Press)

Journey to Data Quality (MIT Press)

[PDF.hj49] Journey to Data Quality (MIT Press)

Journey to Data Quality  Yang W. Lee, Leo L. Pipino, Richard Y. Wang, James D. Funk epub
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 | #1783148 in Books |  2009-08-21 | Original language:English | PDF # 1 |  9.00 x.55 x6.00l,.70 | File type: PDF | 240 pages

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|| ||The issue of data quality has become increasingly important over the last decade as the amount of data being collected and stored continues to increase at a rapid rate. These researchers have been at the forefront of understanding the impact and implication o

All organizations today confront data quality problems, both systemic and structural. Neither ad hoc approaches nor fixes at the systems leve -- installing the latest software or developing an expensive data warehouse -- solve the basic problem of bad data quality practices. Journey to Data Quality offers a roadmap that can be used by practitioners, executives, and students for planning and implementing a viable data and information quality management program....

You easily download any file type for your device.Journey to Data Quality (MIT Press)   |  Yang W. Lee, Leo L. Pipino, Richard Y. Wang, James D. Funk. Just read it with an open mind because none of us really know.

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